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Hyprobe 175 Pin
Fine-Pitch High-Speed Data Interface Solution
The Fine Pitch design supports precise inspection of ultra-small semiconductor devices. High-speed data transmission ensures stable signal integrity. The highly durable probe structure maintains reliable performance even under repeated testing. It can be flexibly applied to a wide range of semiconductor inspection processes.
- Fine pitch connectors: 0.175mm (0.15mm~)
- Pin lifetime more than 300K
- High speed data rate (>30Gbps) (GSSG)
- Easy maintenance (Side plate can be disassembled)
- Rapid mass-production support
- Consistent quality control
- Customizing Design







